Synthesis and Properties of Functional Materials C12

This project is dedicated to the detailed analysis by electron microscopy techniques of organic semiconductor materials employed by other groups within the CRC. Site-specific analyses of the film in functional devices are conducted to link the structure of the organic film to the device performance. Additionally, isolated thin films of organic semiconductors are analyzed to reveal their crystalline nature including grain sizes, types of grain boundaries and defects. As the organic materials are highly beam sensitive and are readily damaged under the electron beam, methodological studies are conducted to study both the damage mechanisms in detail and to improve the specimen preparation.